Thermo Fisher Scientific(TMO)
HQ US55% share
manufactured · input
FIB-SEM Systems for Semiconductor Inspection
Focused ion beam / scanning electron microscope (FIB-SEM) systems used by semiconductor fabs and packaging houses for cross-section failure analysis, defect characterization, TEM sample preparation, and advanced node process control. Required at every leading-edge fab (TSMC, Samsung, Intel, IMEC) for yield improvement and process qualification.
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1 company produce fib-sem systems for semiconductor inspection.